Analog Devices Inc. AD4853 1MSPS Data Acquisition System
Analog Devices Inc. AD4853 1MSPS Data Acquisition System is a 4-channel, 16-bit, 1MSPS data acquisition system (DAS) with differential inputs and a wide common-mode range. The Analog Devices Inc. AD4853 DAS operates on a 5V supply and flexible input buffer supplies. It features a precision, low-drift internal reference, and buffer. Each channel's SoftSpan range can be independently configured to match the application signal swing, reducing the need for external signal conditioning. The AD4853 also includes seamless high dynamic range (SHDR) technology, which automatically optimizes input signal path gain on a sample-by-sample basis, enhancing dynamic range and minimizing noise without affecting linearity.Features
- Complete 16-bit data acquisition system
- Simultaneous sampling of four internally buffered channels
- 1MSPS per channel throughput
- Differential, wide common-mode range inputs
- ±75pA typical input leakage at +25°C
- <300ns full-scale input step settling time
- Integrated reference and reference buffer (4.096V)
- Integrated supply decoupling capacitors
- 57mW per channel at 1MSPS, power scales with throughput
- Minimal external signal conditioning
- Seamless high dynamic range
- Per sample, per channel automatic gain ranging
- Maintains ppm-level INL
- 7.00mm × 7.00mm, 64-ball BGA full solution footprint
- Per channel SoftSpan input ranges, bipolar or unipolar
- ±40V, ±25V, ±20V, ±12.5V, ±10V, ±6.25V, ±5V, ±2.5V
- 0V to 40V, 25V, 20V, 12.5V, 10V, 6.25V, 5V, 2.5V
- Rail-to-rail input overdrive tolerance
- High performance
- ±160μV typical (±40V range) INL
- 94.6dB single-conversion typical (±40V range) SNR
- 98.1dB single-conversion typical (±40V range) DR
- -117dB typical (±40V range) THD
- 120dB typical CMRR
- Digital flexibility
- SPI CMOS (0.9V to 5.25V) and LVDS serial input and output
- Optional oversampling with 16-bit digital averaging
- Optional offset, gain, and phase correction
Applications
- Automatic test equipment
- Avionics and aerospace
- Instrumentation and control systems
- Semiconductor manufacturing
- Test and measurement
Functional Block Diagram
Publicado: 2025-01-07
| Actualizado: 2025-01-13
